Technology

Monitoring thin-film development - Explaining the science behind thin-film monitoring. (576.5kb)
Low noise-to-signal ratio - Advantages of achieving low noise-signal ratio. (237.7kb)
Composition measurements using a multi-wavelength laser interferometer - This paper outlines an approach to determine alloy composition robustly using a laser interferometer. (343.5kb)

ORS has developed highly advanced methods of monitoring the various deposition techniques. Please use the links to view information on how the technology can be used and the scientific explanations behind it, as well as having the option of downloading our recent product specifications.

Application Notes

In situ monitoring for VCSEL - Advantages of live, in situ monitoring for manufacture of VCSEL. (287.4kb)
Quantifying roughness - Advantages of in situ roughness monitoring. (195.7kb)
In situ thickness monitoring for Quantum Cascade Laser - Advantages of in situ monitoring for manufacturing Quantum Cascade Laser. (175.0kb)

Other Published Items

Live Determination of the Physical Properties of a Thin Film During Deposition. (66.5kb)
In-situ reflectance monitoring in MBE. (152.0kb)
Optical Monitoring of MBE Growth of AlN/GaN using Single-Wavelength Laser Interferometry - A Simple Method of Tracking real-time changes in Growth-Rate. (80.4kb)
In situ Characterisation of Nitride Structures in Real Time. (55.9kb)